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Micro LED EL inspection system

Model: MiNY EL

Category:

Exhibitor: HAMAMATSU PHOTONICS TAIWAN CO., LTD.

Booth No: L212

Characteristic

Electrical characteristic measurement and spectrum analysis for Micro LED system.
Features：
1. Full automation system for Micro LED wafer inspection.
2. Optimized software functions customer request.
3. High accuracy probe system for probing Micro LED system.
4. Measurement VF1, VF2, VF3, VR, IR, Cx, Cy, Cd.m2, WD.....
5. Verifying PL inspection result by EL system.
6. Spectrum analysis for emitted light from wafer top and back side (Optional).

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