Magnetic imaging microscope
Model: QD m.1
Category: Semiconductor Package Equipment
Exhibitor: SCIENTECH CORPORATION
Booth No: N/A
Characteristic
Non-destructive imaging
Patented diamond sensor technology
Lateral resolution (xy): down to 1 μm
Depth resolution (z): down to 0.5 μm
Automatic calibration, magnetic field analysis, and current reconstruction
Automated stitching of large areas
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