Inspection items: foreign matter, dirt, scratch, particle, crack, residues, etc.
UPH: 1um defect :12”: 15pcs ;0.5um defect : 12”: 5pcs

TGV Glass AOI
Size: 510mm x 515mm
Resolution: 1.75um/3.5um; Accuracy: ±1um/±2um
Inspection items:
1. foreign matter, dirt, scratch, particle, crack and residues
2. Upper and lower hole and bottleneck aperture, upper and lower hole offset, hole position, hole blockage detection, hole number , roundness"> SHYAWEI OPTRONICS CORPORATION-2026 Touch Taiwan

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SHYAWEI OPTRONICS CORPORATION

Booth No: N229

Website: https://www.shyawei.com.tw/

Exhibitor Profile

Wafer (Si, Quartz) AOI
Range: 4"~6" wafer/8"~12" wafer
Inspection items: foreign matter, dirt, scratch, particle, crack, residues, etc.
UPH: 1um defect :12”: 15pcs ;0.5um defect : 12”: 5pcs

TGV Glass AOI
Size: 510mm x 515mm
Resolution: 1.75um/3.5um; Accuracy: ±1um/±2um
Inspection items:
1. foreign matter, dirt, scratch, particle, crack and residues
2. Upper and lower hole and bottleneck aperture, upper and lower hole offset, hole position, hole blockage detection, hole number , roundness

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Shyawei Optronics

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