Advantest Corporation has recently announced the following leading-edge solutions that address critical challenges in semiconductor testing:

 

• KGD Test Cell for Power Semiconductors

KGD Test Cell optimizes die-level test yields for wide-bandgap (WBG) devices, essential for power semiconductors. Combining the CREA MT Series power device testers with the HA1100 die prober, it provides a seamless solution for maximizing productivity and efficiency.

https://www.advantest.com/en/news/2024/20241210.html

 

 

• ACS Gemini™ Developer Platform

The ACS Gemini™ platform is a new software development tool which allows customers to develop, simulate and debug machine learning applications in a virtual environment. The digital twin of ACS RTDI™, ACS Gemini is part of Advantest's mission to enable customers and partners to utilize data analytics in developing artificial intelligence (AI) and machine learning (ML) solutions for semiconductor testing.

https://www.advantest.com/en/news/2024/20241205.html

 

 

• PMUX02 Power Multiplexer for V93000 EXA Scale Platform

The PMUX02 Power MUX offers unprecedented capabilities for multi-site testing of power and analog devices, including battery management systems (BMS), automotive, and power management ICs. With 22 switches—nearly double the switch density of its predecessor—and an extended voltage range of ± 160 volts (V), PMUX02 will help streamline and reduce the cost-of-test for these high-pin-count, mixed-signal devices.

https://www.advantest.com/en/news/2024/20241119.html

 

 

• Wave Scale RF20ex Test Card

Wave Scale RF20ex enables customers to test virtually any type of radio frequency (RF) device using a single instrument. Wave Scale RF20ex takes the innovations of the V93000 Wave Scale RF solution to a new level, providing double the number of RF ports per instrument and offering future-proof frequency and bandwidth coverage with a frequency range of 100MHz to 20GHz and an industry-leading 2GHz bandwidth capability. It is well equipped to address 5G, Wi-Fi 7, ultra-wideband (UWB) and any other current or future standards in RF.

https://www.advantest.com/en/news/2024/20241118.html

 

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Conference：【L1】International Micro/ Mini LED Display Conference 2025

Speaker：Kotaro Hasegawa, Applied Research & Venture Team Senior VP, Advantest Corporation

Topic：Breakthrough Technology of Micro LED testing for mass production

Register