SQ3000™ 3D CMM for Semiconductor Applications
產品分類:先進設備 - 先進封裝&3D IC
廠商名稱:美商速博光學股份有限公司台灣分公司
攤位號碼:M533
產品特色
THE ULTIMATE IN SPEED AND ACCURACY FOR COORDINATE MEASUREMENT APPLICATIONS - SECONDS. NOT HOURS
SQ3000 CMM utilizes CyberCMM™, a comprehensive software suite of coordinate measurement tools that provides highly accurate, 100% metrology-grade measurement on all critical points much faster than a traditional CMM, including coplanarity, distance, height and datum X, Y to name a few. A fast and easy set-up can be performed in less than an hour for programming complex applications as compared to slow, engineering resource-intensive set-up that typically requires multiple adjustments with traditional coordinate measurement machines (CMM).
Fastest – Seconds, not Hours
Significantly speeds attaining coordinate measurements vs. traditional CMMs. Reduces engineering resource time.
Easy-to-use Interface
Simplifies process with award-winning, intuitive, touch screen experience. Quick programming for complex applications. Multi-process capable – AOI, SPI, AOM, CMM
Metrology-grade Accuracy
Achieve metrology-grade accuracy with MRS-enabled technology. Repeatable and reproducible measurements for metrology, semiconductor, microelectronics and SMT applications.
相關產品
-
PX3000™ Custom 3D AOI Inspection System for Advanced Packaging
-
WaferSense Airborne Particle Sensor™ (APS3)
-
In-line Particle Sensor™ (IPS™)
-
WX3000™ Metrology and Inspection System
-
MX3000™ 3D AOI
-
WaferSense Auto Vibration and Leveling Sensor™ (AVLS3)
-
SQ3000™+ Multi-Function for 3D AOI, SPI & CMM
您可能有興趣的產品
人氣產品專區