Leader of Applied Research and Venture Team Japan Lab
愛德萬測試集團
Breakthrough Technology of Micro LED testing for mass production
Education:Master degree in Electronics Engineering at Tamagawa University in Japan.
Micro-LED has excellent technical advantage, and the manufacturing cost is getting reduced recently. To be mainstream technology, the next bottle neck is the testing cost. <br>The typical test approach on micro-LED is PL, AOI, EL and Diode Characteristic testing. PL and AOI tests are one of good approaches, but it is required to have EL test, Diode Characteristics test after that anyway. Therefore, EL test and Diode Characteristics test efficiency improvement is must for upcoming mass production phases. To improve it, current issues of performance, accuracy, and throughput need to be solved to reach efficient manufacturing cost as entire test workflow level. This presentation introduces testing workflow model and offers brand-new approach of the micro-LED wafer testing especially for upcoming Mass Production. Which has electrical/optical test embedded as single setup, massive parallel test of electrical/optical test with excellent throughput.<br>