• 長谷川　宏太郎

     

    Applied Research & Venture Team Senior VP

    爱德万测试集团

     

     

    主題

     

    Breakthrough Technology of MicroLED Testing for Mass Production

     

    講師簡介

     

    Education:
    Master degree in Electronics Engineering at Tamagawa University in Japan

    Experience:
    Kotaro Hasegawa currently serves as the Leader of Applied Research and Venture Team at Advantest Corporation. In this role, Mr. Hasegawa directs and oversees the new business segment research and enabling on entire Semiconductor value chain. As a semiconductor industry veteran with 31 years of experience, Mr. Hasegawa has established a business as well as developed test technologies for device automated test systems.

     

    演講大綱

     

    Micro-LED has excellent technical advantage, and the manufacturing cost should be getting reduced recently. To be mainstream technology, the next bottle neck is the testing cost. The typical test approach on micro-LED is PL, AOI, EL and Diode Characteristic testing. PL and AOI tests are one of good approaches, but it is required to have EL test, Diode Characteristics test after them. Therefore, EL test and Diode Characteristics test efficiency improvement shall be must for upcoming mass production phases. To improve it, current issues of performance, accuracy, and throughput need to be solved to reach efficient manufacturing cost as entire test workflow. This presentation introduces testing workflow model and offers brand-new approach of the cost reduction on micro-LED wafer testing especially for Mass Production looming in front of us which has electrical/optical test embedded as single setup, super massive parallel test of electrical/optical test with excellent throughput.