CEO
InZiv
High-Throughput EL for microLED Wafer Inspection
●Education
InZiv has recently developed an industrial-level microLED inspection system, the REL, which provides unprecedented speed for EL testing of microLED wafers. Fully compatible with both vertical and flip-chip designs, InZiv’s unique technology offers repeatable, high- accuracy measurements of the chips, with no damage to the device. The REL offers the most critical and reliable microLED inspection, enabling the advancement of all microLED applications.