Now Equipped with White Light Interferometry, Measure from Nanometers to Millimeters VK-X3000 series

 

Model: VK-X3000

Category: Display & Solution - New Display Products

Exhibitor: KEYENCE TAIWAN CO., LTD.

Booth No: M507

 

Characteristic

 

Triple scan approach — Surpassing conventional optical profilers

Measure targets ranging from nanometers to micrometers to millimeters
All-in-one measurement system for in-depth analysis
Best-in-Class 0.01 nm Resolution

3D Surface Profiler

VK-X3000 series

The VK-X3000 3D Surface Profiler uses a triple scan approach, where laser confocal scanning, focus variation, and white light interferometry measurement methods are used, so that high-accuracy measurement and analysis can be performed on any target. The VK-X3000 has a resolution of 0.01 nm and can scan areas up to 50 x 50 mm (1.97" x 1.97"), allowing for measurement of the overall shape of the target while still maintaining high-resolution for analysis of minute surface features. KEYENCE's new 3D Surface Profiler can handle any target, including those with transparent or mirrored surfaces, large height changes, or steep angles.

 

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  The World's First 4K Ultra-High Accuracy Microscope VHX-7000 series

 

 

 

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