Handheld AFM (Atomic Force Microscope)---Introduction Tool for Nanometer Measurement

Category:

Booth No: M334

Characteristic

1. Easily and quickly obtain nanometer surface features
2. Intuitive operation and quick start
3. The world's smallest and powerful
4. The most affordable and best nano measurement tool
5. Taiwan design and manufacture, local service, quality assurance.

Purpose:
Provide three-dimensional surface morphology images, including surface roughness, particle size, height difference and spacing

Overview
The world's lightest, hand-held AFM, providing a brand new choice for physics education and basic nano research!
Powerful performance, exquisite and solid structural design are also a combination of technology and art,

"A huge revolution in the popularization of nanometer measurement is ready to start!"