Wafer type atomic force microscope AFM (applicable to 6-12 inches)
Model: LS-AFM
Exhibitor: UTEK MATERIAL CO., LTD.
Booth No: M334
Characteristic
Ｍain feature:
1. Large-size sample scanning-----can measure the largest sample up to 12 inches
2. Coordinate positioning and automatic needle setting for measurement
3. The most economical and affordable industrial AFM
4. Acquire nanometer surface features quickly and accurately - high-resolution images can be obtained within five minutes
5. Approved by major semiconductor electronics manufacturers
Purpose:
Provides three-dimensional surface morphology images, including surface roughness, particle size, height difference and spacing
Brand: FSM
Model: LS-AFM
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