CSI AFM/Best electrical measurement AFM in the world(Ultra High Resolution PFM/KFM/EAFM/CAFM) Surface Potential Measurement

Model: Nano observer, ResiScope II AFM

Category:

Booth No: M334

Characteristic

Nano-Observer AFM
Best cost effective solution
The Nano-Observer AFM microscope is a flexible and powerful AFM. Designed with the ultimate technologies, it combines performance and ease of use. The USB controller offers a real integrated lock-in for better measurement capability (phase detection, Piezo-Response Mode…).

A low-noise laser and a pre-alignment system provide simplicity and high resolution on a compact AFM head. Its intuitive software simplifies all Atomic Force Microscope settings to allow quick and safe AFM acquisitions.

Compact and robust, the Nano-Observer Atomic Force Microscope fulfills the requirements for advanced users or beginners. It avoids laser alignment with the pre-positioned tip system. A top and side view of the tip/sample, combined with vertical motorized control, makes the pre-approach easy.

HD-KFM The most advanced single-pass KFM mode
HD-KFM developed by CSI for the Nano-Observer AFM has the advantage of amplifying the feedback signal through the second eigenmode of the cantilever. Also it allows a much closer probe of the electric field created by the surface potential compared to other approaches. This is of extreme relevance when imaging small molecules or bidimensional materials.

Surface potential mapping
2nd lock-in amplifier
NO LIFT : Very high sensitivity & higher spatial resolution

Applications
Materials science
Semiconductor
Polymer
Life science