Multifunctional high-performance AFM (roughness, film thickness, surface potential, wafer defect detection)
Model: Park Systems NX7
Exhibitor: UTEK MATERIAL CO., LTD.
Booth No: M334
Characteristic
1. Rich expansion functions: meet various research and development needs
2. High-standard flatbed scanner: Reduces the variables of human post-processing and improves measurement accuracy and reproducibility.
3. Unique non-contact scanning design: Increases probe life by more than 5 times, reduces the risk of high-frequency probe replacement and significantly reduces consumable costs.
4. NX7 is Park Systems, a Korean manufacturer and the world’s number one brand, tailor-made for the most affordable and functional desktop AFM.
5. TSMC designated brand
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