Menu

Home / For Visitors / 2024 Exhibitor Product / Multifunctional high-performance AFM (roughness, film thickness, surface potential, wafer defect detection)

Multifunctional high-performance AFM (roughness, film thickness, surface potential, wafer defect detection)

Model: Park Systems NX7

Category: Compound Semiconductor Equipment

Exhibitor: UTEK MATERIAL CO., LTD.

Booth No: M334

Characteristic

1. Rich expansion functions: meet various research and development needs
2. High-standard flatbed scanner: Reduces the variables of human post-processing and improves measurement accuracy and reproducibility.
3. Unique non-contact scanning design: Increases probe life by more than 5 times, reduces the risk of high-frequency probe replacement and significantly reduces consumable costs.
4. NX7 is Park Systems, a Korean manufacturer and the world’s number one brand, tailor-made for the most affordable and functional desktop AFM.
5. TSMC designated brand

Other Products

Products you may be interested in

Highest Rated Products

TOP