3D Surface Profiler with White Light Interferometry, Measure from Nanometers to Millimeters
Model: VK-X3000 series
Category: Solution
Exhibitor: KEYENCE TAIWAN CO., LTD.
Booth No: L521
Characteristic
Triple scan approach — Surpassing conventional optical profilers
● Measure targets ranging from nanometers to micrometers to millimeters
● All-in-one measurement system for in-depth analysis
● Best-in-Class 0.01 nm Resolution
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