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Optical NanoGauge Thickness measurement system.

Model: C13027

Category: Inspection

Exhibitor: HAMAMATSU PHOTONICS TAIWAN CO., LTD.

Booth No: L321

Characteristic

Noncontact high precision thickness measurement systems utilizing laser interferometry and spectrum interferometry。
Features：
1. Supports PLC connections
2. Shortening of cycle time (max. 200 Hz)
3. Capable of measuring 10 nm thin films
4. Simultaneously measure thickness and color
5. Downsized (30 % less installation area compared to C12562)
6. Covers broad wavelength range (400 nm to 1100 nm)
7. Simplified measurement is added to the software
8. Capable of both surface analysis
9. Precise measurement of fluctuating film
10. Analyze optical constants (n, k)
11. Mapping function

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