Mass Wafer Photoluminescence and Non-contact Leakage Detection Solution

Model: JadeML / ML7000

Category: Micro LED Production Manufacturing Equipment

Booth No: N214

Characteristic

JadeML provides a mass Photoluminescence (PL) and non-contact leakage detection solution for MicroLED wafers, ensuring effective MicroLED chips binning and chip transfer.

【Features】
● 3-in-1 non-contact wafer-level MicroLED chip inspection
● Minimal MicroLED inspection chip size down to 5 μm
● 100% chip photoluminescence strength detection, mapping and binning with 1 μm spatial resolution
● Spectral mapping on the wafer
● 100% chip mapping with 0.5 nm spectral resolution, and provide information including PL intensity, dominant and peak wavelength, full width at half maximum value (FWHM)
● 100% non-contact leakage detection and binning

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Mass Wafer Photoluminescence and Non-contact Leakage Detection Solution

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