Chief Operating Officer
Pentamaster Instrumentation Sdn. Bhd.
Silicon Carbide Wafer Burn In
Experience:
• More than 25 years of experience in computer vision and inspection solutions for semiconductors.
• More than 10 years of experience in test and measurement for sensors, imaging, optics, and photonics products.
• More than 4 years of experience in burn-in, testing, and measurements of silicon carbide wafers, die, packages, and modules.
• Research and Development experience in software platforms for inspection and testing, test hardware, and the testing measurement hardware for high voltage and high current.
• Experience in managing diverse engineering teams encompassing R&D, hardware design, firmware, software, imaging, optics, testing, mechanical design, production, quality, customer services, business development, and other engineering operations.
Silicon carbide wafer-level burn-in is a critical step in the manufacturing process that ensures the reliability, stability, and longevity of the devices. It detects early failures, eliminates defects, stress-tests the devices under extreme high temperatures, provides information to understand performance drift and leakages, and offers an avenue for the overall improvement of product quality and performance.